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| Amber X PFIB - assisted use | Surface analysis & TEM | Compulsory | Tescan | Amber X |
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| Amber X PFIB - self drive | Surface analysis & TEM | Compulsory | Tescan | Amber X |
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| Helios FIB_assisted use | Surface analysis & TEM | Compulsory | FEI/Oxford | Helios Nanolab 600i |
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| Helios FIB_self drive | Surface analysis & TEM | Compulsory | FEI/Oxford | Helios Nanolab 600i |
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| JEOL TEM 2100_assisted use | Surface analysis & TEM | Compulsory | JEOL/Gatan/Oxford | 2100 |
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| JEOL TEM 2100_self drive | Surface analysis & TEM | Compulsory | JEOL/Gatan/Oxford | 2100 |
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| Quanta 650 SEM_assisted use | Surface analysis & TEM | Compulsory | FEI | Quanta 650 |
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| Quanta 650 SEM_self drive | Surface analysis & TEM | Compulsory | FEI | Quanta 650 |
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| SEM lab user 1 | Other processes | Compulsory | Tyndall | Booking |
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| SEM lab user 2 | Other processes | Compulsory | Tyndall | Booking |
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| SEM lab user 3 | Other processes | Compulsory | Tyndall | Booking |
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| Solaris GaFIB - assisted use | Surface analysis & TEM | Compulsory | Tescan | Solaris |
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| Solaris GaFIB - self drive | Device mounting | Compulsory | Tescan | Solaris |
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| TEM/FIB lab user 1 | Other processes | Compulsory | 1 | 1 |
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| TEM/FIB lab user 2 | Other processes | Compulsory | 2 | 2 |
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| Zeiss Supra 40 SEM_assisted use | Surface analysis & TEM | Compulsory | Zeiss | Supra 40 |
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| Zeiss Supra 40 SEM_self drive | Surface analysis & TEM | Compulsory | Zeiss | Supra 40 |